Design of a variable temperature scanning force microscope
نویسندگان
چکیده
منابع مشابه
Design of a variable temperature scanning force microscope.
We have developed the variable temperature scanning force microscope capable of performing both magnetic resonance force microscopy (MRFM) and magnetic force microscopy (MFM) measurements in the temperature range between 5 and 300 K. Modular design, large scanning area, and interferometric detection of the cantilever deflection make it a sensitive, easy to operate, and reliable instrument suita...
متن کاملA variable temperature ultrahigh vacuum atomic force microscope
A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈ 100 K to room temperature. AFM operation above room temperature is also possibl...
متن کاملNew design of a variable-temperature ultrahigh vacuum scanning tunneling microscope
We present the design of a variable-temperature ultrahigh vacuum ~UHV! scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for...
متن کاملA high performance scanning force microscope head design
Since its inception in 1985, the atomic force microscope’ [also known as the scanning force microscope (SFM)] has held great promise for imaging nonconducting samples with subnanometer resolution. Early attempts to image relatively inelastic samples such as graphite, crystals of ionic salts, and semiconductors yielded atomic resolution data. These data provided reason to believe that SFM might ...
متن کاملVariable-temperature independently driven four-tip scanning tunneling microscope.
The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2009
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.3212561